Legacy Course Catalog
ECE 658 - Semiconductor Material And Device Characterization
| Effectivity: | 08/25/2003 - Fall 2007 *** @ Purdue West Lafayette Traditional |
|---|---|
| Credits: | 3 |
| Instructional Types: | Lec |
| Usually Offered: | spr |
| Short Title: | Sc Matl Device Charac |
| Description: | A comprehensive survey of modern characterization techniques routinely used to determine solid-state material and device parameters. Concepts and theory underlying the techniques are examined, and sample experimental results are presented. The coverage includes electrical, optical, chemical, and physical characterization methods. Offered in alternate years. Prerequisite: ECE 60600. |
| School: | School Of Electrical And Computer Engineering |
| Department: | Electrical & Computer Engineering |
| Credit By Exam: | NO |
| Repeatable Flag: | NO |
| Temporary Flag: | NO |
| Full Time Privilege Flag: | NO |
| Honors Flag: | NO |
| Variable Title Flag: | NO |
Fall 2007 *** indicates the course was still an active course and was transferred to the Banner Catalog effective Spring 2008. This course was not expired Fall 2007.
